The International Society for Stereology and Image Analysis (ISSIA) would like to congratulate Dr. Annick De Backer for being the first awardee of the ISSIA PhD competition with her PhD thesis "Quantitative atomic resolution electron microscopy using advanced statistical techniques (2015)". Annick De Backer conducted her PhD thesis under the supervision of Prof. Dr. Sandra Van Aert within the Electron Microscopy of Materials Research (EMAT) group, University of Antwerp.
Many thanks go to the members of the committee who have diligently reviewed all applications for the competition:
- Prof. Dominique Jeulin, Center for Mathematical Morphology, Mines ParisTech, France
- Dr. Zbyněk Pawlas, Charles University in Prague, Czech Republic
- Dr. Katja Schladitz, Fraunhofer Institute for Industrial Mathematics, Germany
Dr. Annick De Backer presented her lecture at the 12th European Congress for Stereology and Image Analysis.
